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Present work investigates the magnetic and electronic structure ofMgO/Fe/MgO/Fe/Co/Au multilayer stack grown on Si(100) substrates by electronbeam evaporation method. X-ray diffraction study depicts polycrystalline natureof the multilayers. Results obtained from vibrating sample magnetometry (VSM)and near-edge X-ray absorption fine structure spectra (NEXAFS) at Fe & Co L-and Mg & O K-edges are applied to understand the magnetic and electronicproperties of this stack and its interface properties. While the spectralfeatures of Fe L-edge spectrum recorded by surface sensitive total electronyield (TEY) mode shows the formation of FeOx at the Fe/MgO interface, the bulksensitive total fluorescence yield (TFY), shows Fe in metallic nature. CoL-edge spectrum reveals the presence of metallic nature of cobalt in both TEYand TFY modes. Above results are well correlated with X-ray reflectometry.

Magnetic and Electronic Structure study of Fe/MgO/Fe/Co Multilayer Stack Deposited by E-Beam Evaporation