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A recent article by Falter et al. (Phys. Rev. B 87, 115412 (2013)) presentsexperimental results using field ion microscopy characterized tips innoncontact atomic force microscopy in order to characterize electrostatic andvan der Waals long range forces. In the article, the tip radius wassubstantially underestimated at ~4.7 nm rather than ~8.1 nm due to subtletiesin the application of the ring counting method. We point out where commonerrors in ring counting arise in order to benefit future experimental work inwhich the determination of tip radius by FIM is important.

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