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In this work Ba(Zn1/3Nb2/3)O3_3$ thin films were prepared by the polymericprecursors method. A detailed description of the procedure to obtain theprecursors and deposition was presented. High quality polycrystalline films ofBa(Zn1/3Nb2/3)O3 were obtained from Pt/Ti/SiO$_2$/Si substrate deposited byspin coating technique. X ray measurements show that the film crystallizes in apartial ordered trigonal structure characteristic of the 1:2 complexperovskites. The partial order and structure was confirmed by Ramanmeasurements. Also, confocal Raman and atomic force microscopy was used tocharacterize the film morphology.

Ba(Zn1/3Nb2/3)O3 thin films obtained by polymeric precursors method