English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

The experimental research on the nature of diffusion by the Mo substrateatoms into the Ti and Cr deposited thin films is completed by the secondaryion-ion emission method. In [1], the initial stage of the Ti thin film on theMo substrate deposition process, using the Ti evaporation technique in thevacuum, is researched. It was found that the Mo substrate atoms diffuse intothe continuously deposited Ti thin film. The diffusion of Mo substrate atoms bythe nodes of crystal grating in the deposited metallic Ti thin film with thecontinuously increasing thickness is theoretically considered in [2]. In thisresearch, the diffusion coefficients of Mo substrate atoms into the Ti and Crthin films are measured by the secondary ion-ion emission method in the Mo-Tiand Mo-Cr systems.

Research on diffusion of Mo substrate atoms into Ti and Cr thin films by secondary ion-ion emission method