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Co /CoO/Co polycrystalline film was grown on Si (001) substrate and magneticproperties have been investigated using in-situ magneto-optic Kerr effectduring growth of the sample. Magnetic anisotropy with easy axis perpendicularto the film surface has been observed in top Co layer, whereas bottom layer wasfound to be soft with in-plane magnetization without any influence of toplayer. Ex-situ in-plane and out-of-plane diffraction measurements revealed thatthe growth of Co on oxidized interface takes place with preferentialorientation of c-axis perpendicular to the film plane, which results in theobserved perpendicular magnetic anisotropy. Texturing of the c-axis is expectedto be a result of minimization of the interface energy due to hybridizationbetween Co and oxygen at the interface.

Interface induced perpendicular magnetic anisotropy in Co/CoO/Co thin film structure: An in-situ MOKE investigation