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Significant changes of the relative permittivity of a silver film have beendetected using the surface plasmon resonance (SPR) method when a constantelectric field is applied to a MDM (metal-dielectric-metal) nanostructure. Thestructure looks like a capacitor with a 177-nm dielectric corundum film placedbetween two silver films 49nm and 37nm thick. The effect manifests itself as anoticeable change of the reflectivity of the structure when the voltage of upto 30V is applied to the electrodes. We have a good agreement between thetheory and experiment only if we suppose that the optical parameters of anodeand cathode silver films change differently and the Al_2O_3 film absorbs theincident light. The refraction coefficient of the cathode silver layer is shownto become zero when the applied voltage is above 16V.

Drastic Changes in Dielectric Function of Silver Under dc Voltage