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We investigate in this paper the origin of perpendicular anisotropy in Co(1.6 nm)/Pt (3.0 nm) bilayers grown on alumina and annealed up to650$^{\circ}$C. Above 350$^{\circ}$C, all layers exhibit perpendicularanisotropy. Then coercive fields increase linearly with annealing temperaturefollowing two different rates: 0.05 T/100$^{\circ}$C below 550$^{\circ}$C and0.8 T/100$^{\circ}$C above. By making careful structural characterizationsusing x-ray diffraction and transmission electron microscopy, we demonstratethe presence of short range correlation of L1$_{1}$ type below 550$^{\circ}$Cwhereas above 550$^{\circ}$C, L1$_{0}$ chemical ordering is observed. Weconclude that perpendicular anisotropy observed in Co/Pt bilayers grown onalumina and annealed may not only be due to interface anisotropy as usuallyinvoked but also to CoPt alloying and chemical ordering that take place duringpost-growth annealing.

Origin of perpendicular anisotropy in thin Co/Pt bilayers grown on alumina