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In the last decade, metamaterials-based superlenses, with a resolution belowAbbe's diffraction limit, have emerged. To obtain a rough estimate of theresolution of such superlenses, imaging of two subwavelength slits, separatedby a subwavelength gap \textit{d} is typically performed. The resolution$\Delta$ of the lens corresponds to the minimum possible gap $d_{min}$ forwhich a distinct image of the two slits can be resolved ($\Delta \simd_{min}$). In this letter, we present a more quantitative estimate of theresolution of manufactured lenses by fitting analytical near-field imageprofiles, obtained from imaging a two-slit object with a theoreticalnegative-index lens of known resolution, to experimental data. We conclude thediscussion by applying our analytical method to 3 case examples of superlensingfrom the literature. As shown, this method is particularly attractive forrapidly assessing the performance of fabricated superresolution lenses.

Robust method to determine the resolution of a superlens by analyzing the near-field image of a two-slit object