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In the present work we show that the correct determination of surfacemorphology using Scanning Force Microscopy (SFM) imaging and Power SpectralDensity (PSD) analysis of the surface roughness is an extremely demanding taskthat is easily affected by experimental parameters such as scan speed andfeedback parameters. We present examples were the measured topography data issignificantly influenced by the feedback response of the SFM system and the PSDcurves calculated from this experimental data do not correspond to that of thetrue topography. Instead, either features are "lost" due to low pass filteringor features are "created" due to oscillation of the feedback loop. In order toovercome these serious problems we show that the interaction signal (errorsignal) can be used not only to quantitatively control but also tosignificantly improve the quality of the topography raw data used for the PSDanalysis. In particular, the calibrated error signal image can be used incombination with the topography image in order to obtain a correctrepresentation of surface morphology ("true" topographic image). From this"true" topographic image a faithful determination of the PSD of surfacemorphology is possible. The corresponding PSD curve is not affected by thefine-tuning of feedback parameters, and allows for much faster imageacquisition speeds without loss information in the PSD curve.

Nanoscale measurement of the Power Spectral Density of surface roughness: a difficult experimental challenge and how to solve it