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It is well-known that the variations of Goos-H\"anchen shifts (GHSs) areclosely associated with the enengy-flux provided by evanescent states in thecase of total internal reflection. However, when the frustrated internal totalreflection (FTIR) is realized with a Polymethyl Methacrylate (PMMA)double-prism system operated in the microwave frequency range of 8.2 GHz to12.4 GHz, we observe that the GH shifts for the reflected beam show periodicresonances with varying the operation frequency or the air layer thickness,which is different from the variation of the corresponding reflected energy.Moreover, in another FTIR based system introduced by a composite absorptivematerial slab with a two-dimensional top layer of frequency selective surface(FSS), the GHSs for reflected beam are discovered as not only resonant but alsonegative with the incidence of transverse electric that is TE polarized.

Frustrated Total Internal Reflection: Resonant and Negative Goos-H\"anchen Shifts in Microwave Regime