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Practical applications of graphene require a reliable high-throughput methodof graphene identification and quality control, which can be used forlarge-scale substrates and wafers. We have proposed and experimentally tested afast and fully automated approach for determining the number of atomic planesin graphene samples. The procedure allows for in situ identification of theborders of the regions with the same number of atomic planes. It is based on anoriginal image processing algorithm, which utilizes micro-Raman calibration,light background subtraction, lighting non-uniformity correction, and the colorand grayscale image processing for each pixel. The outcome of the developedprocedure is a pseudo-color map, which marks the single-layer and few-layergraphene regions on the substrate of any size that can be captured by anoptical microscope. Our approach works for various substrates, and can beapplied to the mechanically exfoliated, chemically derived, deposited orepitaxial graphene on an industrial scale.

Large-Area High-Throughput Identification and Quality Control of Graphene and Few-Layer Graphene: Prospects of Industry-Scale Applications