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Thin Bi2Te3 flakes, with as few as 3 quintuple layers, are opticallyvisualized on the SiO2-capped Si substrates. Their optical contrasts vary withthe illumination wavelength, flake thickness and capping layers. The maximumcontrast appears at the optimized light with the 570nm wavelength. The contrastturns reversed when the flake is reduced to less than 20 quintuple layers. Acalculation based on the Fresnel law describes the above observation with theconstructions of the layer number-wave length-contrast three-dimensional (3D)diagram and the cap thickness-wavelength-contrast 3D diagram, applicative inthe current studies of topological insulating flakes.

Visualizing topological insulating Bi2Te3 quintuple layers on SiO2-capped Si substrates and its contrast optimization