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This paper describes an integrated framework for SOC test automation. Thisframework is based on a new approach for Wrapper/TAM co-optimization based onrectangle packing considering the diagonal length of the rectangles toemphasize on both TAM widths required by a core and its corresponding testingtime. In this paper, we propose an efficient algorithm to construct wrappersthat reduce testing time for cores. We then use rectangle packing to develop anintegrated scheduling algorithm that incorporates power constraints in the testschedule. The test power consumption is important to consider since exceedingthe system's power limit might damage the system.

Wrapper/TAM Co-Optimization and Test Scheduling for SOCs Using Rectangle Bin Packing Considering Diagonal Length of Rectangles