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We report on the observability of valence bonding effects inaberration-corrected high resolution electron microscopy (HREM) images alongthe [010] projection of the mineral Forsterite(Mg2SiO4). We have also performedexit wave restorations using simulated noisy images and have determined thatboth the intensities of individual images and the modulus of the restoredcomplex exit wave are most sensitive to bonding effects at a level of 25% formoderately thick samples of 20-25 nm. This relatively large thickness is due todynamical amplification of bonding contrast arising from partial de-channelingof 1s states.

Optimized conditions for direct imaging of bonding charge density in electron microscopy