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An experimental investigation of the critical current noise in underdampedniobium based Josephson junctions by a technique based on the switching currentmeasurements is reported. By sweeping the junction with a current ramp wemeasure the critical current switching using the standard time of flighttechnique and analyze the data to extract the current noise. The experimentalresults show a linear behavior of the current white noise from both thejunction area and the temperature. These measurement provide very usefulinformation about the intrinsic noise of Josephson devices involving SQUIDs andqubits.

Current Noise Investigation in Josephson Devices by Switching Current Measurements