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We report on the detection and charge distribution analysis for nitrogensubstitutional dopants in single layer graphene membranes byaberration-corrected high-resolution transmission electron microscopy (HRTEM).Further, we show that the ionicity of single-layer hexagonal boron nitride canbe confirmed from direct images. For the first time, we demonstrate by acombination of HRTEM experiments and first-principles electronic structurecalculations that adjustments to the atomic potentials due to chemical bondingcan be discerned in HRTEM images. Our experiments open a way to discernelectronic configurations in point defects or other non-periodic arrangementsor nanoscale objects that can not be analyzed in an electron or x-raydiffraction experiment.

Charged defects in graphene and the ionicity of hexagonal boron nitride in direct images