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Cadmium Sulfide (CdS) is one of the highly photo sensitive and good semiconductor material of II-VI group elements. Cadmium Sulfide (CdS) have different applications in optoelectronic devices like solar cells, photo detectors etc. In the present work CdS thin films were deposited on ultrasonically cleaned glass substrates using sol-gel spin-coating technique. The structural, optical and surface morphologies of CdS thin films were investigated by X-ray diffraction (XRD) analysis, UV-Visible Spectrum analysis, Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The Crystallographic Structure was determined from XRD analysis. It reveals the films were Crystallized in Hexagonal phase with (0 0 2) plane. The Band gap is calculated from Tauc's plot from Absorbance Spectrum. The determined Band gap values of CdS thin films Decreases with Increase in Annealing Temperature. AFM gives the roughness of the CdS films. SEM studies reveals that the grains are spherically shaped and distributed uniformly over the entire surface of the glass substrate. Electrical Properties of the Cadmium Sulfide (CdS) thin films were studied with I-V measurement system .

Cadmium Sulfide (CdS) Based Thin Films for Photo Sensing Application