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The ternary alloy of (CdS)0.6Te0.4 thin films were deposited onto rotating amorphous glass substrates by using closed space sublimation, at a base pressure of 10 -5 torr. The crystalline, morphological, optical and transport properties of the deposited films were studied by using X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), UV-VIS-NIR Spectrophotometer, Four Probe method and Thermo Electric Power (TEP) measurement. The XRD exhibits the deposited thin film has polycrystalline nature having monoclinic phase. The dislocation density (δ), strain (e) and the number of crystallites per unit area (N) have been found to be 2.047 x 10 14 lines / cm 2 , 0.9926 and 9.264 x 10 17 respectively. The SEM reveals the homogeneity of the deposited samples. Optical study performed to estimate optical band gap using absorbance spectra and found to be in the range of 1.6 - 2.1 eV. The four probe method estimates the Electrical Resistivity = 0.2045 Ω-cm and Activation Energy = 0.01822 eV. The Fermi energy = 0.2628 eV and Scattering Coefficient = 2.3188 evaluated by using TEP.

Synthesis and Characterization of Nanocrystalline (CdS) 0.6Te0.4 Thin Films Deposited by Closed Space Sublimation Technique