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Nanocrystalline films of PbS have been deposited on glass sustrates at room temperature by CBD method. The structural parameters of PbS films have been studied by X-ray line profile analysis using Williamson Hall and Modified Williamson Hall method. The crystallite sizes are found in between 4.99-53.9 nm, strain in the films in the range of 7.4x10 -4 - 2.82 x 10 -3 and dislocation densities are found to be very high ~ 10 15 -10 16 m -2 .

X-Ray Line Profile Analysis of Chemically Deposited Nanostructured PBS Films