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processing subsystems are connected in series. The optimal measuring subsystem is so defined that minimizes its cost satisfying the conditions for the diagnostic reliability and the diagnostic accuracy. The usefulness of this method is demonstrated by applying it to a fault diagnosis system for a test plant, where the signals from the plant are classified into •gtoo high•h, •gnormal•h and •gtoo low•h and the fault diagnosis is performed using the signed digraph.

An Optimal Design Problem of Sensor Allocation for a Class of Fault Diagnosis Systems