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The microstructural characterization and electrical properties of the manganese oxides/silver nanocomposite thin films are investigated by the conducting probe atomic force (CP-AFM). The nanocomposite thin films were obtained thriugh electrodeposited by potentiostatic method with silver acetate (AgC2H5OOH) and potassium permanganate (KMnO4) aqueous solution. The morphology for the thin films was examined by atomic force microscopy (AFM), Scanning Electronic Microscopy (SEM) and transmission electron microscopy (TEM). The spherical Ag2O nanoparticles of several nanometer are dispersed homogeneouly in the thin films and cubic shape Ag nanoparticles of about about 100nm are spreaded on the surface of MnOx thin film. The thickness of the MnOx thin film is about 250nm. The schottky junction between Ag and MnOx with rectifying behavior was evidenced by CP-AFM measurement. The turn-on voltage for the junction is around 0.69V

Structural Characterization and Electrical Property of the Manganese Oxides/Silver Nanocomposite Thin Films