Open AccessElectron-Acoustic Microscopic Study on Dislocation Lines in the Base Region of npn Si–Tr
Author(s) -
Hiroshi Takenoshita
Publication year - 1986
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/jjaps.25s1.194
Subject(s) - dislocation , acceleration voltage , materials science , scanning electron microscope , common emitter , voltage , electron microscope , biasing , electron , optoelectronics , analytical chemistry (journal) , optics , physics , chemistry , cathode ray , composite material , chromatography , quantum mechanics
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