Open AccessStructural, Optical and AC Conductivity Studies on Polycrystalline-Si/Nanocrystalline-FeSi2 Composite Thin Films
Author(s) -
Yuta Saito,
H. Katsumata
Publication year - 2020
Language(s) - English
Resource type - Conference proceedings
DOI - 10.7567/jjapcp.8.011301
Subject(s) - materials science , nanocrystalline material , crystallite , annealing (glass) , thermal conduction , electrical resistivity and conductivity , thin film , conductivity , composite number , nanocrystal , condensed matter physics , composite material , nanotechnology , metallurgy , electrical engineering , chemistry , physics , engineering
We investigated an electrical conduction mechanism of Si/FeSi2 composite films by measuring a frequency dependence of AC electrical conductivity. The results were analyzed based upon Jonscher's power law. The hopping conduction obeying the Jonscher’s power law was observed for a-Si single films after annealing as well as Si/FeSi2 composite films annealed at 550 and 900°C. From the analysis of XRD, optical absorption, TEM/EDS and AC conductivity, we conclude that the electrical conduction mechanisms in polycrystalline (poly)-Si/β-FeSi2 annealed at 550°C and poly-Si/αand β-FeSi2 annealed at 900°C are due to electron hopping via the conduction band of β-FeSi2 and α-FeSi2 nanocrystals embedded in poly-Si thin films, respectively.
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