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We investigated the detection of discrete charge dynamics of an electron trap in a GaAs-based nanowire surface through current fluctuation induced by a metallic scanning probe tip. An equivalent circuit model indicated that the charge state in the surface strongly reflects the channel potential when the local surface potential is fixed by the metal tip, which suggests that random charging and discharging dynamics of the trap appears as random telegraph signal (RTS) noise in the nanowire current. Experimental demonstration of the concept was carried out using a GaAs-based nanowire and an atomic force microscope (AFM) system with a conductive tip. We observed the RTS noise in the drain current and superposition of the Lorentzian component in the noise spectrum when the metal tip was in contact with the nanowire surface at specific positions. The obtained results indicate the possibility of detecting charge dynamics of the individual surface trap in semiconductor devices

Detection of discrete surface charge dynamics in GaAs-based nanowire through metal-tip-induced current fluctuation