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X-ray powder diffraction and electrical resistivity measurements wereperformed on the tetragonal compound CeCoSi under pressure to elucidate thephase boundary of the pressure-induced structural transition and the change inthe 4$f$ electronic state. The temperature-pressure phase diagram has beendetermined from the shift of the Bragg peaks and from the anomaly in theresistivity. The critical pressure, $P_{\rm s}$ $\sim$ 4.9 GPa at 300 K,decreases to $P_{\rm s}$ $\sim$ 3.6 GPa at 10 K. The decrease of $P_{\rm s}$ isdue not only to the decrease in volume of the unit cell but also to ananisotropic shrinkage by cooling. When crossing the boundary to thehigh-pressure phase, the resistivity shows a significant drop to exhibit ametallic temperature dependence. The results of this study strongly suggestthat the structural phase transition can be ascribed to valence instability ofCe-$4f$ electron.

Structural Phase Transition and Possible Valence Instability of Ce$-4f$ Electron Induced by Pressure in CeCoSi