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In the Earth and Planetary science, high-sensitive, high-spacial resolution and high-mass resolution mass spectrometer is indispensable. So far, Secondary Ion Mass Spectrometers (SIMSs), of which spacial resolution is 1~10 μm, have been used for isotopic measurement of individual minerals in the terrestrial/extraterrestrial rocks. However, it is known that secondary ion yield of SIMS is very low (less than 1 %) and that most of sputtered “neutral” atoms/molecules are wasted. To overcome this weakness of SIMSs, we designed and has developed the post-ionization system using high-intensity laser, which enables to ionized the neutrals after the sputtering (we call it, “post-ionization”). Here we report on our recent progresses of a development of multi-turned TOF-SIMS with a femto-second laser for post-ionization (OPTIMA: Osaka PosT-Ionization Mass spectrometer) and also report the first application for presolar SiC grains from Murchison meteorite.

proceedings of the 14th international symposium on nuclei in the cosmos (nic2016)

Development on Multi-Turn TOF-SIMS with a Femto-Second Laser for Post-Ionization: First Application of OPTIMA (Osaka PosT-Ionization MAss spectrometer) for Presolar SiCs