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In the image acquisition tests of image sensors and modules, how to compare pixel values, how to digitize “defect”, and how to determine “fault” are extremely varied from test equipments. Therefore, setup of test equipments for image acquisition characteristics should be customized for target devices under test. In general, test procedures are delivered as technical documents in not standardized but arbitrary formats. So test equipment should be manually programmed fitting individual setup condition. This costs huge time and effort and has high risk of human error. In this paper, the standardized description method is proposed to apply to almost all existing tests where various tests are described in a single framework.

Standardized Description Method of Image Acquisition Characteristics Tests for Image Sensors and Modules