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A method was developed to correct the Raman frequencies of the D, G and D, bands in the first order Raman spectrum for carbon materials with an incident excitation beam of 514.5 nm. It was demonstrated that the lighting of the Ne lamp set at a proper position in the Raman spectrometer during the measurement of the first order spectrum causes superposition of the 556.28nm line from Ne lamp at 1458.52cm-1 in Raman shift scale on the first order Raman spectrum, being of use as a standard. There could be a practical application on the plots of the Raman frequency of the G band (G-RF) vs. interlayer spacing don for carbon materials in assessing quality. The method is demonstrated for determination of G-RF for a cleaved surface of a kish graphite, an HOPG edge plane, PC basal planes, a polished surface of commercially available isotropic graphite, a buffed surface of glass-like carbon and side surfaces of benzene-derived vapor-grown carbon fibers.

tanso

A method for origin correction of Raman band frequencies in the first order Raman spectrum for carbon materials and Raman frequency of G band versus d002 plots