English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

The Second Workshop on Industrial Applications of Scanned Probe Microscopy (IASPM) was held at the National Institute of Standards and Techn ology, on May 2–3 1995 [1]. The meeting, co-sponsored by NIST, SEMATECH, the American Society for Testing and Materials (ASTM) E42.14 Subcommittee, and the Manufacturing Science and Techn ology Group of the American Vacuum Society (AVS), was attended by approximately one hundred scanned probe microscopy (SPM) users, suppliers, and researchers from industry, government, and academia. The workshop featured over fifty industry overv iews and technical presentations of SPM-based research and development (R&D) activities arranged into three oral focus sessions and poster presentations. A fourth session was devoted to progress on SPM measurement standardization and tool development issues which have occurred since the previous workshop.

Conference Report: Second Workshop on Industrial Applications of Scanned Probe Microscopy Gaithersburg, MD May 2-3, 1995 - Abstracts