English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

acterization techniques that are useful to the semiconductor industry. Because of the increasing importance of in-line and in-situ characterization methods, the workshop placed a strong emphasis on these methods. Specific goals of the workshop were: (1) to provide a forum in which measurements and technical issues of current and future interest to the semiconductor industry could be reviewed, discussed, critiqued, and summarized; (2) to demonstrate and review important applications for diagnostics, manufacturing, and in-situ monitoring and control in real-time environments; (3) to provide a silicon integrated circuit process and materials-based view of requirements for off-line, in-line, and in-situ analysis and metr ology; (4) to focus attention on the critical and unique requirements related to compound semiconductor materials and devices; and (5) to act as an important stimulus for new progress in the field by providing new perspectives. The workshop provided a concise and effective portrayal of industry characterization needs and the problems that must be addressed by industry, government, and academia to continue the dramatic progress in semiconductor techn ology.

journal of research of the national institute of standards and technology

Conference Report: International Workshop on Semiconductor Characterization: Present Status and Future Needs - Gaithersburg, MD, January 30 February 2, 1995