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Angle-resolved photoemission is a direct probe of the momentum-resolvedelectronic structure and proved influential in the study of bulk crystals withnovel electronic properties. Thanks to recent technical advances, thistechnique can now be applied for the first time for the study of van der Waalsheterostructures built by stacking two-dimensional crystals. In this article wewill present the current state of the art in angle-resolved photoemissionmeasurements on two-dimensional materials and review this still young field. Wewill focus in particular on devices similar to those used in transport andoptics experiments, including the latest developments on magic-angle twistedbilayer graphene and on the in-operando characterization of gate tunabledevices.

Electronic structure of 2D van der Waals crystals and heterostructures investigated by spatially- and angle-resolved photoemission