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Raman microscopy, which is sensitive to chemical bonds, defects, structure, is a suitable tool that can give information on how a material can be modified by interacting with ions. We will first give concrete examples on how it can be used to characterize with a micro‐ metric resolution samples extracted from tokamaks. We will then give concrete examples on what information can be obtained by doing a study on laboratory synthesized materi‐ als, benchmarking Raman microscopy with quantitative techniques. The first part of the chapter is focused on carbon‐based material analysis. We will show how Raman spectra are sensitive to the presence of hydrogen, a major safety issue in the field. The second part of the chapter will be focused on beryllium‐ and tungsten‐based material analysis. We will show that hydrogen can be stored as an hydride after ion implantation and that it can be released easily in tungsten oxide.

Raman Microscopy: A Suitable Tool for Characterizing Surfaces in Interaction with Plasmas in the Field of Nuclear Fusion