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Technology at the nanoscale has become one of the main scientific world challenges as new quantum physical effects appear and can be modulated at will (Kastner, 1992). Superconductors, materials for spintronics, electronics, optoelectronics, chemical sensing, and new generations of functionalized materials are taking advantage of the low dimensionality, improving their properties and opening a new range of applications (De Franceschi et al., 2003; Samuelson et al., 2004; Fischer et al., 2006; Pettersson et al., 2006; Wang et al., 2006; Hernandez-Ramirez et al., 2007; Qin et al., 2007; Appenzeller et al., 2008; Boukai et al., 2008; Hochbaum et al., 2008; Wang et al., 2008; Colombo et al., 2009; Thunick et al., 2009). These new materials for future applications are being synthesized at the nanoscale (ultrathin layers, nanoparticles, nanowires or nanotubes functionalized). Among all these new materials, one-dimensional (1D) nanostructures such as nanowires, are one of the most used and promising morphologies (Lieber, 2003; Yang, 2005; Thelander et al., 2006; Lieber & Wang, 2007). Groups all around the world in the area of materials science, physics, chemistry and biology work in close collaboration with nanoscopy tools as there is a critical need for the structural, chemical and morphological characterization of the synthesized nanostructures at atomic scale in order to correlate these results with the physical and chemical properties and functionalities they present. In order to obtain an accurate control and understanding of these new materials properties, it is essential to access their structure and chemistry at atomic scale. Electron Microscopy and more precisely (scanning) transmission electron microscopy ((S)TEM) and electron spectroscopy related techniques (also known as electron nanoscopies) have thus a preeminent role in advanced materials science. Recent developments in electron microscopy, such as aberration correctors and monochromators are allowing us to reach sub-angstrom and sub-eV, spatial and energy resolutions, respectively. In addition to these advances, the possibility to obtain 3D models of our nanostructures by means of electron tomography, have shown that Electron Microscopy related techniques are the most promising to fully characterize complex

Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models