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An X-ray absorption fine structure (XAFS) spectroscopy is a powerful and useful technique to probe the local electronic structure and the local atomic structure around an absorbing atom in an unknown material [Stohr, 1996, Ohta, 2002]. A highly bright X-ray source, synchrotron radiation (SR) is usually used for XAFS measurements to obtain reliable spectra, even for elements of very low content in a sample.

XAFS Measurement System in the Soft X-ray Region for Various Sample Conditions and Multipurpose Measurements