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Orientation Microscopy (OM) is a technique for determining the crystallites orientations in the automatic way using systems for acquisition and indexing diffraction patterns in grid of points refers to sample coordinate system. In this way, plenty of additional information about examined material can be provided. As a conventional method of orientation visualization, color code map is used; however, data behind each pixel is applicable for further computing. Quantifying parameters and characteristics based on the sets of measured orientations provide essential information about grains, grain boundaries and about local crystallographic lattice deformation.

Orientation Microscopy in the Transmission Electron Microscope - Investigations of Small Orientations Changes by Means of Orientation Mapping in TEM