English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

There are several standard measurement techniques for characterizing magnetic materials, e.g. an Epstein frame is commonly used for identifying the magnetic properties of a material (Sievert, 2000). However, this requires extra samples of the magnetic material used in the electromagnetic device. These extra samples are often not available. Moreover, the characteristics of the magnetic material may be altered during the device manufacturing (Takahashi et al., 2008). Therefore, it is convenient to characterize the material on the specific geometry of the device itself.

Magnetic Material Characterization Using an Inverse Problem Approach