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There is a rising demand for the development of alternative materials used for the electronic devices. This is partially due to the difficulties in a further miniaturization of current siliconbased transistors. Carbon nanotube (CNT) is considered as the most prominent candidate for this purpose (Joachim et al., 2000, Tans et al., 1997, Saito et al., 1998). The electronic property of the CNT can be regarded as a combination of those of a molecule and a solidstate bulk material, which appears as a quantum mechanical behavior at a relatively high temperature including the ballistic conductivity (Javey et al., 2003). The realization of these novel phenomena would be the key for the CNT to be widely used in real applications. For these demands, it requires precise controls of the electronic states whose size reaches to the spatial structure of the electronic wavefunctions. It cannot be realized without a precise measurement of those properties, but there are not many characterization tools with the required resolution. Scanning tunneling microscopy (STM) has played an important role in atomic scale characterization. It has been known that the CNT becomes metallic or semiconductive depending on the wrapping of the CNT, which is often cataloged by its chirality. Despite its importance, a technique for its precise measurement is not well established. This is partially because conventional diffraction techniques like as low-energy electron diffraction (LEED) or reflection high-energy electron diffraction (RHEED) cannot be applied to the characterization of molecule like CNT tubes. The atomic scale resolution of STM enables an estimation of the internal structure of the CNT, which has been employed to the determination of the chirality. However, a precise determination of the chirality is not an easy task. STM can also detect the electronic structure in addition to the structural characterization. A clear example can be seen in the observation of the standing wave formed by the interference of an electronic state of CNT, which is an appearance of the wavefunctions. (Lemay et al., 2001, Venema et al., 1999) Using this technique, the band structure of the CNT has been determined. (Ouyang et al., 2002, Lee et al., 2004) Here in this chapter, we discuss the STM measurements focusing on the superlattice structures detected near the end-cap of the CNT. We combine high-resolution STM imaging

STM Observation of Interference Patterns Near the Endcap and Its application to the Chiral Vector Determination of Carbon Nanotubes