English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Critical current density on the electromigration failure is a commonly observed phenomenon in the integrated circuit (IC) interconnect. The critical current density is important for the lognormal distribution and failure time extrapolation of IC metal conductors. In this paper, we report the critical current density (jc) of semiconductor laser degradation for the first time. Despite of the different physical origin, the jc of the laser degradation exhibits similar effect on the failure time distribution. We develop a new kinetic defect diffusion model that can account for the existence of jc. We discuss the physical mechanism and its implication in the reliability extrapolation of diode lasers.

A New Kinetics Defect Diffusion Model and the Critical Current Density of Semiconductor Laser Degradation