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Temperature measurements of dielectric permittivity are performed fornonstoichiometric ferroelectric lead germanate Pb$_{4.95}$Ge$_3$O$_{11}$ andmultiferroic solid solution [N(C$_2$H$_5$)$_4$]$_2$CoClBr$_3$. Unlike the heatcapacity data, the analysis of the dielectric permittivity of ferroics isusually performed at the assumption that the dielectric "background" isnegligible compared with its critical part. In this work we quantitativelyinterpret the dielectric properties of the single crystals mentioned above andthe appropriate literature data for multiferroic Sr$_2$IrO$_4$ crystals, usinggeneralized Curie-Weiss formulas that combine corrections due to a nonlineartemperature-dependent dielectric background, a modified critical index ofelectric susceptibility, and a diffuse character of phase transition. We arguethat taking account of the temperature dependent dielectric background canimprove notably the quantitative analysis of PTs for a number of classes of theferroic materials.

Nonlinear background corrections to dielectric permittivity of ferroics and multiferroics