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Most of the reflectometry methods which are used for determining the phase ofcomplex reflection coefficient such as reference method and Variation ofSurroundings medium are based on solving the Schr\"odinger equation using adiscontinuous and step-like scattering optical potential. However, during thedeposition process for making a real sample the two adjacent layers are mixedtogether and the interface would not be discontinuous and sharp. The smearingof adjacent layers at the interface (smoothness of interface), would affect thereflectivity, phase of reflection coefficient and reconstruction of thescattering length density (SLD) of the sample. In this paper, we haveinvestigated the stability of reference method in the presence of smoothinterfaces. The smoothness of interfaces is considered by using a continuousfunction scattering potential. We have also proposed a method to achieve themost reliable output result while retrieving the SLD of the sample.

Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by neutron reflectometry