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In this paper we discuss a methodology for efficient real-time measurements of high-resolution mixedsignal circuits implemented on the IC. The methodology could be used for real time built-in self-tests of a fail-safe mixed-signal integrated circuits and as a measurement part of a self-aware algorithm and methodology for integrated mixed-signal circuits. We show that a pseudo-random noise signal is a good option for the signal source and that the methodology leads to the efficient and cost-effective measurements in real time. The measurement is running in parallel to the main signal processing. The method is theoretically analyzed and verified using Matlab models and simulations. As an example the response of high precision, high order Σ-Δ ADC with most important non-ideal effects is compared to the response of a bit-true model of a reference digital circuit. The differences are demonstrated using simple area-efficient cross-correlation algorithm that can be implemented in software or in digital hardware.

REAL TIME MEASUREMENTS OF HIGH RESOLUTION MIXED-SIGNAL CIRCUITS FOR SELF AWARE EMBEDDED SYSTEM