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Recent developments in the application of micro-energy-dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF)\udhave opened up new opportunities for fast geoscientific analyses. Acquiring\udspatially resolved spectral and chemical information non-destructively for\udlarge samples of up to 20 cm length provides valuable information for\udgeoscientific interpretation. Using supervised classification of the\udspectral information, mineral distribution maps can be obtained. In this\udwork, thin sections of plutonic rocks are analyzed by µ-EDXRF and\udclassified using the supervised classification algorithm spectral angle\udmapper (SAM). Based on the mineral distribution maps, it is possible to\udobtain quantitative mineral information, i.e., to calculate the modal\udmineralogy, search and locate minerals of interest, and perform image\udanalysis. The results are compared to automated mineralogy obtained from the\udmineral liberation analyzer (MLA) of a scanning electron microscope (SEM)\udand show good accordance, revealing variation resulting mostly from the\udlimit of spatial resolution of the µ-EDXRF instrument. Taking into\udaccount the little time needed for sample preparation and measurement, this\udmethod seems suitable for fast sample overviews with valuable chemical,\udmineralogical and textural information. Additionally, it enables the\udresearcher to make better and more targeted decisions for subsequent\udanalyses

geoscientific instrumentation, methods and data systems

Automated mineralogy based on micro-energy-dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to a mineral liberation analyzer