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We present results of the 18 August 2002 flare analysis as anexample for developing a diagnostic tool for thermal and non-thermalprocesses in chromospheric lines. Taking into account the hard X-ray(HXR) emission, we attempted to derive the Hα and Hβ lineproperties which were caused by the non-thermal electron contributionand could be useful for diagnostic purposes. The flare itself was asequence of harder and softer bursts in HXR and we investigated threeflare kernels associated with them. Two of the kernels appearedsimultaneously. This phase of the flare could be observed in a broadband of wavelengths (HXR, UV, optical and microwaves). Kernel 1 didnot clearly coincide with any HXR source but its intensity increasedwith the HXR flux rise. The flare kernel~3 did not show any significantresponse in microwaves, however, the related HXR flux was comparablewith the flux of the previous kernels. We carried out an analysis of thedifference between the Hα/Hβ profile rate in the linecenter at the distance of 0.5 Å from the line center. Onlykernel 2 showed parameter fluctuations that were related to HXRflux evolution. The supposition of the non-thermal electron effect on theHα/Hβ  profile ratio was confirmed only at the  kernelconnected with the 25–50 keV HXR source. We found furtherconfirmation that the Hα/Hβ line intensity ratio could beused as a diagnostic tool for non-thermal electron presence

Non-thermal particle effects on the Hα and Hβ line profiles in the 18 August 2002 solar flare