Open AccessMorphological and electrical characterization of Cu-doped PbS thin films with AFM
Author(s) -
Illia Dobryden,
Baligh Touati,
Abdelaziz Gassoumi,
Alberto Vomiero,
Najoua KamounTurki,
Nils Almqvist
Publication year - 2017
Publication title -
advanced materials letters
Language(s) - English
Resource type - Journals
eISSN - 0976-397X
pISSN - 0976-3961
DOI - 10.5185/amlett.2017.1545
Subject(s) - materials science , doping , kelvin probe force microscope , thin film , work function , band gap , surface roughness , nanotechnology , atomic force microscopy , semiconductor , analytical chemistry (journal) , optoelectronics , composite material , chemistry , layer (electronics) , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom