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Kelvin probe force microscopy (KPFM) can be used to monitor electrostatic charges on the surfaces of materials. In this paper, we describe the use of KPFM to evaluate the electrostatic effect induced by silver nanoparticles incorporated as clusters in diamond-like carbon (DLC) films, before and after scratching. The results are compared to those obtained for DLC films without silver nanoparticles. Raman spectroscopy was used to identify the DLC signature, and energy dispersive X-ray spectroscopy (EDX) was used to confirm the presence of silver in the film. The morphology of the DLC film containing silver was investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The findings suggest that the incorporation of silver nanoparticles in amorphous materials could offer new options for electrostatic energy storage on the surfaces of these materials.

EVALUATION OF TRIBOELECTRICITY IN DIAMOND-LIKE COATINGS CONTAINING SILVER NANOPARTICLES USING AFM AND KPFM