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This paper discusses how compiler optimizations influence software reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation-induced control-flow errors. Supported by a comprehensive fault-injection campaign using an established benchmark suite in the embedded systems domain, we show that the compiler is a non-negligible source of noise when hardening the software against radiation- induced soft errors.

Compiler Optimizations Impact the Reliability of the Control-Flow of Radiation-Hardened Software