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This paper discusses the development and engineering of electricalspectroscopy for simultaneous and non invasive measurement of electricalresistivity and dielectric permittivity. A suitable quadrupolar probe is ableto perform measurements on a subsurface with inaccuracies below a fixed limit(10%) in a bandwidth of low (LF) frequency (100kHz). The quadrupole probeshould be connected to an appropriate analogical digital converter (ADC) whichsamples in phase and quadrature (IQ) or in uniform mode. If the quadrupole ischaracterized by a galvanic contact with the surface, the inaccuracies in themeasurement of resistivity and permittivity, due to the IQ or uniform samplingADC, are analytically expressed. A large number of numerical simulations provesthat the performances of the probe depend on the selected sampler and that theIQ is better compared to the uniform mode under the same operating conditions,i.e. bit resolution and medium.

Optimal Requirements of a Data Acquisition System for a Quadrupolar Probe Employed in Electrical Spectroscopy