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The quality of thin film is influenced by the presence of complexing agents such as Na 2EDTA. The Cu 4SnS 4 thin films were deposited onto indium tin oxide glass substrate by chemical bath deposition method. The structural, morphological and optical properties of the deposited films have been studied using X-ray diffraction, atomic force microscopy and UV-Vis spectrophotometer, respectively. The XRD data showed that the films have a polycrystalline and orthorhombic structure. It also indicated that the most intense peak at 2 θ = 30.2° which belongs to (221) plane of Cu 4SnS 4. The film deposited with 0.05 M Na 2EDTA showed good uniformity, good surface coverage with bigger grains and produced higher absorbance value. The band gap energy varies with the variation of Na 2EDTA concentration which ranging from 1.56-1.60 eV. Deposition at concentration of 0.05 M Na 2EDTA proved to offer a reasonably good Cu 4SnS 4 thin film.

bulletin of the chemical society of ethiopia

&lt;b&gt;Influence of complexing agent (Na&lt;sub&gt;2&lt;/sub&gt;EDTA) on chemical bath deposited Cu&lt;sub&gt;4&lt;/sub&gt;SnS&lt;sub&gt;4&lt;/sub&gt; thin films&lt;/b&gt;