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In this report, we calculated the angular dependence of exchange bias (Hex) by using single domain model in exchange coupled ferromagnetic (F)/antiferromagnetic (AF) bilayers, which results with AF thickness (tAF) were used for the analysis of measured ones in NiFe/MnIr bilayers. Angular dependence of Hex calculated at tAF > tc showed typical unidirectional behaviors, however, calculated one at 0.5tc < tAF < tc showed peculiar angular behaviors by fixed AF spins at specified angle near θH = 90 o. Angular dependence of Hex measured in NiFe/MnIr (20 nm) bilayers showed typical unidirectional behaviors. However, measured one in NiFe/MnIr (4 nm) bilayers showed mixed behaviors including both of unidirectional and peculiar angular behaviors, which was explained by the grain size distribution of polycrystalline MnIr.

Angular Dependence of Exchange Bias in NiFe/MnIr Bilayers