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In this paper, we present the implementation of a built-in current sensor (BICS) which takes into account the increased background current of defect-free circuits and the effects of process variation on ΔI<sub>DDQ</sub> testing of CMOS data converters. A 12-bit digital-to-analog converter (DAC) is designed as the circuit under test (CUT). The BICS uses frequency as the output for fault detection in CUT. A fault is detected if it causes the output frequency to deviate more than ±10% from the reference frequency. The output frequencies of the BICS for various (MOSIS) model parameters are simulated to check for the effect of process variation on the frequency deviation. A set of eight faults simulating manufacturing defects in CMOS data converters are injected using fault-injection transistors and tested successfully

circuits and systems

Δ&amp;lt;i&amp;gt;I&amp;lt;sub&amp;gt;DDQ&amp;lt;/sub&amp;gt;&amp;lt;/i&amp;gt; Testing of a CMOS Digital-to-Analog Converter Considering Process Variation Effects